Home/Modules/Measurement Suite
Analysis module

Calibrated measurement
every µm accounted for

Porosity, decarburization depth, dendrite arm spacing, coating layers — and the everyday geometry of lines, angles, arcs, curves and polygons. Every number is in true micrometres, because the calibration factor is bound to the objective that took the image.

PorosityDecarb depth DASLayer thicknessµm geometry
Capabilities

What the suite covers

Porosity

Void fraction on polished sections — cast components, additive parts, thermal-spray coatings. Thresholded, reviewed, reported as %.

Area fraction · per field

Decarburization depth

Measure total and effective decarb layers from the surface inward on etched sections, with calibrated depth callouts.

Surface → core, in µm

Dendrite arm spacing

Secondary DAS by intercepts across dendrite arms — the fingerprint of solidification rate in castings.

SDAS · µm

Layers & coatings

Plating, galvanizing, carburized cases, weld overlays — thickness measured point by point along the interface.

Multi-point thickness

Geometry

Lines, angles, arcs, curves, polygons — snap them onto any feature and read the answer in µm or degrees.

Full toolset

Annotations

Callouts, labels and dimension lines that live on the image and land in the report exactly as you drew them.

Report-ready
MT-IAS Pro — Measurement · Layer thickness · 102.jpg
MT-IAS Pro layer thickness measurement: a surface layer bounded by two flexible red lines measured at 150.65 µm on a calibrated micrograph with a 100 µm scale bar, the full geometry and curve toolset in the ribbon, and the live Nikon MA200 panel
The real workspace: a surface layer measured between flexible boundary lines — L1 = 150.65 µm on the calibrated field (100 µm scale bar burned in) — with the full line / angle / arc / curve toolset in the ribbon.
Why it's trustworthy

Calibration you don't have to think about

A measurement is only as good as its µm-per-pixel factor. MT-IAS Pro binds calibration to two things at once:

The objective

Each lens carries its own calibration factor. With the motorized turret integration, rotating the nosepiece — from the screen or by hand — switches the factor automatically. No stale 10× calibration under a 50× image, ever.

The camera

Calibrations are hardware-bound to the exact sensor and resolution they were made with (MultitekHDCam & NNCam). A different camera or mode can't silently reuse the wrong factor.

Common questions

What can MT-IAS Pro measure on a micrograph?

Lines, angles, arcs, curves, polygons and annotations — plus dedicated workflows for porosity, decarburization depth, dendrite arm spacing and layer/coating thickness. Everything reads out in calibrated µm.

How is accuracy maintained across objectives?

The calibration factor follows the engaged objective automatically (via the MA200 turret integration) and is bound to the exact camera hardware. The wrong factor simply can't be applied.

How do I measure decarburization depth correctly?

Etch, find the transition, measure from the surface inward at several positions — the details matter. We wrote a practical guide: Measuring decarburization depth.

Can measurements be exported?

Annotated micrographs and all measurement data export to Excel or PDF on your letterhead — the drawing you made on screen is the drawing in the report.

Measure something you already know

Bring a certified stage micrometer or a known coating to the demo — verify the calibration story yourself.